AFM calibration

Company NT-MDT supply with the full set of calibration standards for SPM lateral and vertical calibration, detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.

AFM submicron calibration (278nm)

Company NT-MDT supply with the grating for SPM and STM submicron calibration in X or Y direction.

Test grating for SNOM

Company NT-MDT supply with the special test grating for Scanning Near Field Optical Microscope.

Grating sets

Company NT-MDT offer three different grating sets.