Company NT-MDT offer SPM probes for noncontact/semicontact modes with wide range of resonant frequencies and force constants.
Probes can be supplied with or without Au reflective coating (standard products are coated with Au reflective coating).
Noncontact/semicontact cantilevers also can be supplied without tips.

Company NT-MDT offer SPM probes for contact modes with the range of resonant frequencies and force constants.
Probes can be supplied with or without Au reflective coating (standard products are coated with Au reflective coating).
Contact cantilevers also can be supplied without tips.

Company NT-MDT supply with conductive SPM probes for working in the modes: Scanning Capacitance mode (SCM), Scanning Kelvin Mode (SKM), Spreading Resistance Imaging (SRI), Electrostatic Force (EFM), I-V curve spectroscopy, voltage lithography.
Probes of any series (NSG01, NSG10, NSG11, NSG20, NSG03, CSG01, CSG10, CSG11) are available with four conductive coating - W2C, TiN, Pt, Au. Thickness of conductive coatings is 20-30nm. Typical tip curvature radius is about 35nm.

Company NT-MDT supply with magnetic SPM probes for working in the MFM mode. 
Noncontact probes of  NSG01 and NSG03 series are available with CoCr magnetic coating. Thickness of  magnetic coating is about 40nm. Typical tip curvature radius is about 45nm.
Guaranteed lifetime for magnetic cantilevers is 3 months from the date of receiving an order.
Box with cantilevers are supplied with Silica Gel inside the package.

Any "Golden" probe series can be supplied with calibrated SEM photo for each tip.
Guaranteed curvature radius of SEM-controlled cantilevers is 10nm or less.
Cantilever series with calibrated SEM photo has letter "S" in the series name.